References

1. N. Abbasi, O. Hasan & S. Tahar (2011): Formal Analysis of Soft Errors using Theorem Proving. Technical Report. Department of Electrical & Computer Engineering, Concordia University, Canada.. Available at http://hvg.ece.concordia.ca/Publications/TECH_REP/SERTP_TR11.
2. H. Masuda et. al. (1980): A 5 V-only 64K dynamic RAM based on high S/N design.. IEEE Journal of Solid-State Circuits SC-15(5), pp. 846 – 853, doi:10.1109/JSSC.1980.1051481.
3. P. Audebaud & C. Paulin-Mohring (2009): Proofs of Randomized Algorithms in Coq. Science of Computer Programming 74(8), pp. 568–589, doi:10.1016/j.scico.2007.09.002.
4. G. E. P. Box & Mervin E. Muller (1958): A Note on the Generation of Random Normal Deviates. Annals of Mathematical Statistics 29(2), pp. 610–611, doi:10.1214/aoms/1177706645. Available at http://projecteuclid.org/euclid.aoms/1177706645.
5. M.J.C. Gordon (1989): Mechanizing Programming Logics in Higher-0rder Logic. In: Current Trends in Hardware Verification and Automated Theorem Proving. Springer, pp. 387–439, doi:10.1007/978-1-4612-3658-0_10.
6. J. Harrison (2005): A HOL Theory of Euclidean Space. In: Proceedings of the 18th international conference on Theorem Proving in Higher Order Logics, LNCS 3603. Springer, pp. 114–129, doi:10.1007/11541868_8.
7. O. Hasan (2008): Formal Probabilistic Analysis using Theorem Proving. PhD Thesis. Concordia University, Montreal, QC, Canada. Available at http://spectrum.library.concordia.ca/975852/.
8. O. Hasan, N. Abbasi, B. Akbarpour, S. Tahar & R. Akbarpour (2009): Formal Reasoning about Expectation Properties for Continuous Random Variables. In: Formal Methods, LNCS 5850. Springer, pp. 435–450, doi:10.1007/978-3-642-05089-3_28.
9. J. Hölzl & A. Heller (2011): Three Chapters of Measure Theory in Isabelle/HOL. In: Interactive Theorem Proving, LNCS 6898. Springer, pp. 135–151, doi:10.1007/978-3-642-22863-6.
10. J. Hurd (2002): Formal Verification of Probabilistic Algorithms. PhD Thesis. University of Cambridge, Cambridge, UK. Available at http://www.gilith.com/research/papers/thesis.pdf.
11. B. Keeth (2008): DRAM Circuit Design: Fundamentals and High-Speed Topics. IEEE.
12. R. W. Keyes (1975): Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated Electronics.. IEEE Journal of Solid-State Circuits SC-10(5), pp. 245 – 247, doi:10.1109/JSSC.1975.1050600.
13. R. Khazanie (1976): Basic Probability Theory and Applications. Goodyear.
14. P. A. Layman & S. G. Chamberlain (1989): A Compact Thermal Model for Investigation of Soft Error Rates in MOS VLSI Digital Circutis. IEEE Journal of Solid-State Circuits 24(1), pp. 79 – 89, doi:10.1109/4.16305.
15. T. C. May & M. H. Woods (1979): Alpha-particle-induced Soft Errors in Dynamic Memories. IEEE Transactions on Electron Devices ED-26(1), pp. 2 – 9, doi:10.1109/T-ED.1979.19370.
16. N. Metropolis & S. Ulam (1949): The Monte Carlo Method. Journal of the American Statistical Association 44(247), pp. 335–341, doi:10.1080/01621459.1949.10483310. Available at http://www.jstor.org/stable/2280232.
17. T. Mhamdi, O. Hasan & S. Tahar (2010): On the Formalization of the Lebesgue Integration Theory in HOL. In: Interactive Theorem Proving, LNCS 6172. Springer, pp. 387–402, doi:10.1007/978-3-642-14052-5_27.
18. T. Mhamdi, O. Hasan & S. Tahar (2011): Formalization of Entropy Measures in HOL. In: Interactive Theorem Proving, LNCS 6898. Springer, pp. 233–248, doi:10.1007/978-3-642-22863-6_18.
19. H. Okazaki & Y. Shidama (2009): Probability on Finite Set and Real-Valued Random Variables. Formalized Mathematics 17(1-4), pp. 129–136, doi:10.2478/v10037-009-0014-x. Available at http://versita.metapress.com/content/D3073K63W370G262.

Comments and questions to: eptcs@eptcs.org

For website issues: webmaster@eptcs.org