P. Asirelli, M.H. ter Beek, A. Fantechi & S. Gnesi (2011):
Formal description of variability in product families.
In: E.S. de Almeida, T. Kishi, C. Schwanninger, I. John & K. Schmid: SPLC'11.
IEEE,
pp. 130–139,
doi:10.1109/SPLC.2011.34.
P. Asirelli, M.H. ter Beek, A. Fantechi & S. Gnesi (2012):
A compositional framework to derive product line behavioural descriptions.
In: T. Margaria & B. Steffen: ISoLA'12,
LNCS 7609.
Springer,
pp. 146–161,
doi:10.1007/978-3-642-34026-0_12.
M.H. ter Beek & E.P. de Vink (2014):
Towards modular verification of software product lines with mCRL2.
In: T. Margaria & B. Steffen: FMSPLE track at ISoLA'14,
LNCS 8802.
Springer,
pp. 368–385,
doi:10.1007/978-3-662-45234-9_26.
M.H. ter Beek & E.P. de Vink (2014):
Using mCRL2 for the analysis of software product lines.
In: S. Gnesi & N. Plat: FormaliSE workshop at ICSE'14.
IEEE,
pp. 31–37,
doi:10.1145/2593489.2593493.
A. Classen, M. Cordy, P. Heymans, P.-Y. Schobbens, A. Legay & J.-F. Raskin (2013):
Featured transition systems: Foundations for verifying variability-intensive systems and their application to LTL model checking.
IEEE Trans. Software Eng. 39,
pp. 1069–1089,
doi:10.1109/TSE.2012.86.
A. Classen, P. Heymans, P.-Y. Schobbens, A. Legay & J.-F. Raskin (2010):
Model checking \@@underline lots\z@ of systems: Efficient verification of temporal properties in software product lines.
In: J. Kramer, J. Bishop, P.T. Devanbu & S. Uchitel: ICSE'10.
ACM,
pp. 335–344,
doi:10.1145/1806799.1806850.
M. Cordy, A. Classen, G. Perrouin, P.-Y. Schobbens, P. Heymans & A. Legay (2012):
Simulation-based abstractions for software product-line model checking.
In: M. Glinz, G.C. Murphy & M. Pezzè: ICSE'12.
IEEE,
pp. 672–682,
doi:10.1109/ICSE.2012.6227150.
S. Cranen, J.F. Groote, J.J.A. Keiren, F.P.M. Stappers, E.P. de Vink, W. Wesselink & T.A.C. Willemse (2013):
An overview of the mCRL2 toolset and its recent advances.
In: N. Piterman & S.A. Smolka: TACAS'13,
LNCS 7795.
Springer,
pp. 199–213,
doi:10.1007/978-3-642-36742-7_15.
R. De Nicola & F.W. Vaandrager (1995):
Three logics for branching bisimulation.
J. ACM 42(2),
pp. 458–487,
doi:10.1145/201019.201032.
D. Fischbein, S. Uchitel & V.A. Braberman (2006):
A foundation for behavioural conformance in software product line architectures.
In: R.M. Hierons & H. Muccini: ROSATEA workshop at ISSTA'06.
ACM,
pp. 39–48,
doi:10.1145/1147249.1147254.
R.J. van Glabbeek (1990):
The linear time – branching time spectrum (extended abstract).
In: J.C.M. Baeten & J.W. Klop: CONCUR'90,
LNCS 458.
Springer,
pp. 278–297,
doi:10.1007/BFb0039066.
R.J. van Glabbeek (1993):
The linear time – branching time spectrum II: The semantics of sequential systems with silent moves (extended abstract).
In: E. Best: CONCUR'93,
LNCS 715.
Springer,
pp. 66–81,
doi:10.1007/3-540-57208-2_6.
R.J. van Glabbeek & W.P. Weijland (1989):
Branching time and abstraction in bisimulation semantics (extended abstract).
In: G.X. Ritter: IFIP Congress'89.
North-Holland,
pp. 613–618.
Available at http://theory.stanford.edu/~rvg/abstracts.html#11.
R.J. van Glabbeek & W.P. Weijland (1996):
Branching time and abstraction in bisimulation semantics.
J. ACM 43(3),
pp. 555–600,
doi:10.1145/233551.233556.
J.F. Groote & F.W. Vaandrager (1990):
An efficient algorithm for branching bisimulation and stuttering equivalence.
In: M. Paterson: ICALP'90,
LNCS 443.
Springer,
pp. 626–638,
doi:10.1007/BFb0032063.
K.G. Larsen & B. Thomsen (1988):
A modal process logic.
In: LICS'88.
IEEE,
pp. 203–210,
doi:10.1109/LICS.1988.5119.
R. Milner (1989):
Communication and Concurrency.
Prentice Hall.
R. Paige & R.E. Tarjan (1987):
Three partition refinement algorithms.
SIAM J. Comput. 16(6),
pp. 973–989,
doi:10.1137/0216062.
T. Thüm, S. Apel, C. Kästner, I. Schaefer & G. Saake (2014):
A classification and survey of analysis strategies for software product lines.
ACM Comput. Surv. 47(1):6,
doi:10.1145/2580950.
M. Tribastone (2014):
Behavioral relations in a process algebra for variants.
In: S. Gnesi, A. Fantechi, P. Heymans, J. Rubin & K. Czarnecki: SPLC'14.
ACM,
pp. 82–91,
doi:10.1145/2648511.2648520.
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